CinLine Tool  

Industrial Solution - Laser Line Characterization

The CinLine tool is a compact and unique tool to measure beam profiles of cw and pulsed laser systems from the UV to NIR spectral range. This system includes a special designed diffusion screen and the camera-based CinCam CCD/CMOS beam profiler with an high-performance imaging optic.

The sophisticated screen architecture enables speckle-free beam profiling especially of laser lines, rectangle profiles or laser with large beam diameter.

NEW:   Line Scan Beam Profiler

- Customized solution (depends on the application)
- Fully automated line beam analysis
- Available with high-resolution CCD / CMOS / InGaAs sensor
- 250-1800nm (depends on sensor)
- Fast measurements
- Line width, homogeneity, edge steepness, etc.
- Scalable for up to 16x beam profiler
- Variable beam lengths
- Sensitivity correction (multi beam profiler)
- Remote-controllable via XML-RPC interface