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UV-NIR Beam Profiler
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CinCam CCD

CinCam InGaAs

CinCam CMOS
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CinSquare M Tool

CinSpot Tool

CinLine Tool

Near Field Tool
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IR Module / Coating

UV Coating

Neutral Density Filter

Prism Attenuator

Beam Reducer
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Near Field Tool

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Scientific Solution - Near Field Measurement

CINOGY Technologies near field beam profiling option is suitable for focus spot measurements and near field imaging of fiber ends or output surfaces from laser diodes over a wide wavelength range. The set-up based on the compact CinCam CMOS models and can be assembled with different microscope objectives. These calibrated microscope objectives assured maximum accuracy and enables imaging of small beam structures on the diffraction limit.

Magnification:

 

4x (calibrated)

10x (calibrated)

20x (calibrated)

40x (calibrated)

Spectral response (+NIR / IR Option):

 

320-1150nm 

320-1150nm 

320-1150nm 

320-1150nm 

Data output:

 

8Bit / 10Bit

8Bit / 10Bit

8Bit / 10Bit

8Bit / 10Bit

Numerical aperture (NA):

 

0.1

0.25

0.4

0.65

Working distance (WD):

 

15.8mm

10.0mm

3.3mm

0.6mm

Focal length:

 

29.8mm

15.26mm

8.55mm

4.39mm

Optical resolution:

 

~2m

~1.5m

~1.2m

~1.0m

Accuracy:

 

Beam size <2%

Beam size <2%

Beam size <2%

Beam size <2%

Beam profiler:

 

CinCam CMOS / CinCam CMOS Nano

Input power (max):

 

100mW@4x, 10x / 10mW@20x, 40x / 1320nm and 1550nm on request

Near Field Beam Profiler
3D Beam Profile

NIR Option

Residual Silicon Response (1320nm)

IR Option

Sensor Coating (1470-1605nm)

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